Integrated circuit die including a temperature detection circuit, and system and methods for calibrating the temperature detection circuit
US7102417B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 5, 2004 |
| Grant date | Sep 5, 2006 |
| Priority date | — |
| Expiry date | Dec 5, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31908
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An integrated circuit die is disclosed including a temperature detection circuit and a memory configured to store calibration data. The temperature detection circuit is operatively coupled to the memory, and receives an input signal. The temperature detection circuit is configured to produce an output signal dependent upon the input signal and indicative of whether a temperature of the integrated circuit die is greater than a selected temperature. During a normal operating mode of the integrated circuit die the input signal comprises the calibration data. A system and methods for calibrating the temperature detection circuit are also described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.