Method for determining power of modulated signals from a frequency transformed interferogram
US7102755B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 22, 2002 |
| Grant date | Sep 5, 2006 |
| Priority date | — |
| Expiry date | Oct 6, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2009/0238
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method determines power of a modulated signal that is applied to a wavelength meter by summing bin values within a designated bin range of a frequency transformed interferogram representing the modulated signal and provided by the wavelength meter. In a first embodiment of the method, the bin range within which the bin values are summed is designated by mapping a series of signal characteristics indicative of the types of the modulated signals applied to the wavelength meter, to a series of bin spans within the frequency transformed interferograms that represent the modulated signals. The method then enables a selection of a signal characteristic from the series of signal characteristics to identify the modulated signal that is applied to the wavelength meter. In response to a selection, the bin values are summed within a bin range that is consistent with the mapping of the series of signal characteristics to the series of bin spans and that is positioned about a center bin of the frequency transformed interferogram. In a second embodiment of the method, the bin range within which bin values are summed is designated automatically based on attributes of the frequency transformed i…
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