Patent · US Expired

Methods for estimating the body voltage of digital partially depleted silicon-on-insulator circuits

US7103522B1 · kind B1 · utility

17Cited by
7References
3Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 9, 2000
Grant dateSep 5, 2006
Priority date
Expiry dateMay 24, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/367
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Techniques for estimating a body voltage of one or more transistors which form digital partially depleted silicon-on-insulator circuit, and for using estimated voltages to analyze electrical properties of the circuit, are disclosed. In one technique, device models are obtained and abstracted to generate simplified electrical descriptions of the transistors. The circuit topology is checked to generate sets of accessible states for the transistors that are indicative of whether a connection between a source or a drain of a transistor and either a power supply or ground exists. Next, sets of reference state body voltage minima and reference state body voltage maxima are determined for each of the transistors based on corresponding simplified electrical descriptions and corresponding sets of accessible states. Finally, a target state body voltage minima and a target state body voltage maxima are ascertained, one for each transistor, based on the determined sets of reference state body voltage minima and reference state body voltage maxima.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.