Method and apparatus for visualizing metrics in a data space
US7103843B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 25, 2001 |
| Grant date | Sep 5, 2006 |
| Priority date | — |
| Expiry date | Jun 28, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/323
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present invention discloses a method and apparatus for dynamically monitoring and visualizing metrics within a system that has values which change over time. The values associated with these metrics can be specific to entities within the system or they can be common system-wide metrics. Various attributes can be defined for the metrics to be visualized. The values can then be determined in conformance with these defined data attributes. The values can be mapped to appropriate unique indicators which can be used to represent a visual indication of the determined value. The graphical representation of the entities within the system can be displayed along with unique indicator used to represent the value associated with the metric to be displayed. The metrics to be displayed can be selected from a list. Additionally, the measurements can be periodically made and the display accordingly updated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.