Method for in situ measurement of the optical offset of an optical component
US7103953B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 22, 2003 |
| Grant date | Sep 12, 2006 |
| Priority date | — |
| Expiry date | Jan 6, 2024 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/49998
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
Embodiments of the invention generally provide an in situ method for assembling and measuring optical characteristics of an optical component. The method generally includes pressing an optical source or lens into an optical housing while simultaneously measuring the optical output of the device. The measured optical output is used to determine and control when the optical source or lens is pressed to an optical position within optical housing. Once the source or lens is pressed into the optical housing, the method includes measuring the optical offset and/or pointing angle of the assembled component in the same apparatus that assembled the component. The measured optical offset and/or pointing angle information is used to determine how to mechanically alter the optical housing to correct or compensate for the optical offset and pointing angle.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.