Plasma ion mobility spectrometer
US7105808B2 · kind B2 · utility
10Cited by
14References
36Claims
0Family size
Assignee
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Key dates
| Filing date | Jun 10, 2004 |
| Grant date | Sep 12, 2006 |
| Priority date | — |
| Expiry date | Jun 10, 2024 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/0031
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Ion mobility spectrometer. The spectrometer includes an enclosure for receiving a sample therewithin and an electron beam window admits an electron beam into the enclosure to ionize the sample in an ionization region. A shutter grid is spaced apart from the ionization region and means are provided for sample ion preconcentration upstream of the shutter grid. The ion preconcentration is effective to reduce space charge resulting in a lowered threshold detection level.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.