Microbolometer focal plane array with temperature compensated bias
US7105818B2 · kind B2 · utility
10Cited by
14References
15Claims
0Family size
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Key dates
| Filing date | Apr 27, 2005 |
| Grant date | Sep 12, 2006 |
| Priority date | — |
| Expiry date | Apr 27, 2025 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/76
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A readout circuit for an array of substrate-isolated microbolometer detectors includes a bias source that varies in accordance with changes in substrate temperature as detected by a temperature sensor that has temperature characteristic that resembles the temperature characteristic of the microbolometer detector array so as compensate detector measurements for temperature induced errors in the microbolometer focal plane array read out.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.