High frequency scanning SQUID microscope and method of measuring high frequency magnetic fields
US7106057B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Mar 17, 2005 |
| Grant date | Sep 12, 2006 |
| Priority date | — |
| Expiry date | Mar 27, 2025 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S505/846
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A scanning SQUID microscope capable of high frequency magnetic field measurements uses a hysteretic SQUID detector and a pulsed sampling technique which permits to extend the bandwidth of the SQUID microscope to above GHz region. The system can be readily incorporated into a 4.2k scanning SQUID microscope for imaging chips at room temperature. By biasing the hysteretic SQUID with pulses of a predetermined amplitude, and adjusting a modulation flux applied to the hysteretic SQUID at a plurality of time delays between the activation of the sample under study and the bias pulse, the hysteretic SQUID can be switched on, and the modulation flux value corresponding to such a switching event as a function of time is considered as representation of the magnetic field emanating from the sample under study.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.