Patent · US Expired

Method and measuring device for locating enclosed objects

US7106072B2 · kind B2 · utility

12Cited by

5References

25Claims

0Family size

Assignee

Robert Bosch GmbH · DE

Inventors

Stefan Clauss · Echterdingen, DE
Uwe Skultety-Betz · Echterdingen, DE
Bjoern Haase · Stuttgart, DE
Ulli Hoffmann · Mühlacker, DE

Key dates

Filing date	Jan 17, 2003
Grant date	Sep 12, 2006
Priority date	—
Expiry date	Jan 17, 2023

Classification

Technology area (CPC G)Physics
CPC primaryG01V3/088
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for locating objects enclosed in a medium, according to which a detection signal is generated by at least one capacitive sensor device, the detection signal penetrating the medium that is to be analyzed in such a way that information is obtained about an object that is enclosed in the medium by evaluating the detection signal, particularly by measuring impedance, wherein, to obtain depth information about the object that is enclosed in the medium, an algorithm is used to evaluate the detection signal that calculates a compensation for drift effects of the capacitive sensor device that is generating the detection signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.