Method and apparatus for measuring a signal spectrum
US7106790B2 · kind B2 · utility
0Cited by
4References
5Claims
0Family size
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Key dates
| Filing date | May 7, 2002 |
| Grant date | Sep 12, 2006 |
| Priority date | — |
| Expiry date | Mar 29, 2024 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B17/327
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A spectrum analyzer used for making a spectrum emission mask measurement reorganizes execution of the measurement so that all frequency bands to be measured at the same resolution bandwidth are measured in a single sweep, extending between the extreme frequency limits of those bands, thereby avoiding setup delays involved in specifying successive measurements for each band individually. Portions of each measurement which correspond to frequency bands to be measured at the respective resolution bandwidth of that measurement are extracted, resized as necessary, and assembled into a complete spectrum measurement.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.