Patent · US Expired

Transformer testing

US7107186B2 · kind B2 · utility

8Cited by
16References
30Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 31, 2003
Grant dateSep 12, 2006
Priority date—
Expiry dateNov 28, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/2846
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for transformer testing includes receiving a failing test result of a transformer, the test result being determined from a test taken during transformer manufacture, determining, via a knowledge-based system, a predicted root cause of the failure based on the test result and a knowledge base of transformer information, and determining, via the knowledge-based system, a suggested course of action for the failure based on the test result and the knowledge base of transformer information.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.