Method and apparatus for calibration of indirect measurement systems
US7108424B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 11, 2004 |
| Grant date | Sep 19, 2006 |
| Priority date | — |
| Expiry date | May 14, 2024 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B6/583
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A calibration technique is presented for calibrating non-reference indirect measurement systems with respect to a reference indirect measurement system. A reference map function filling procedure fits a reference map function based on known values of a parameter of interest associated with reference calibration samples and corresponding reference values associated with the reference calibration samples. A correction function fining procedure fits a correction function based on reference values for calibration samples measured on or simulated for the reference indirect measurement system and corresponding values measured on the non-reference indirect measurement system. During normal use, the non-reference indirect measurement system obtains measurements, corrects the measurements using the correction function, and estimates the parameter of interest of the object of interest using the reference map function based on the corrected measurements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.