Test head docking system and method
US7109733B2 · kind B2 · utility
7Cited by
22References
41Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 12, 2002 |
| Grant date | Sep 19, 2006 |
| Priority date | — |
| Expiry date | Jul 12, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2851
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for docking an electronic test head with a handling apparatus is provided. The system includes an assembly for at least partially aligning and subsequently bringing together the electronic test head and the handling apparatus. The system also includes a power driven actuator for providing only partially powered assistance in bringing together the electronic test head and the handling apparatus.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.