Systems and methods for sensing marking substrate area coverage using a spectrophotometer
US7110142B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 2, 2001 |
| Grant date | Sep 19, 2006 |
| Priority date | — |
| Expiry date | Aug 24, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03G2215/00042
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A multiple-LED sensor is used to detect area coverage of marked patches on a marking substrate. The same sensor may also be used for color calibration. The marking substrate area coverage sensor obtains reflectance measurements from marked patches of a marking substrate. For example, the marked patches may be patches of a marking substance such as toner, ink or paint, or patches marked by etching or the like. A Neugebauer model may be used to obtain the reflectance measurements. A batch least squares algorithm may be used to estimate the appropriate parameters of the Neugebauer model. For improved accuracy, a recursive least squares algorithm may be used. The recursive least squares algorithm allows the marking substrate area coverage sensor to calibrate itself to changes in the sensing environment.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.