X-ray measuring apparatus
US7110487B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 17, 2004 |
| Grant date | Sep 19, 2006 |
| Priority date | — |
| Expiry date | Jan 12, 2025 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B6/032
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An x-ray measuring apparatus comprises an x-ray source, an x-ray detector, a rotating device, and a processor. The x-ray source generates x-rays to be emitted to a subject. The x-ray detector detects measurement data regarding the subject. The rotating device changes a relative position of the x-ray source and the x-ray detector with respect to the subject. The x-ray detector is shifted by a distance shorter than half the length of the x-ray detector along a line parallel to the plane of rotation, in a tangential direction of the plane of rotation generated by the x-ray source. The processor obtains projection data by executing a logarithmic converting process for the measurement data, multiplies a value of the projection data by a weight, and obtains reconstructed data therefrom.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.