Determination of waveguide parameters
US7110900B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 7, 2004 |
| Grant date | Sep 19, 2006 |
| Priority date | — |
| Expiry date | Apr 7, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V1/30
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of determining at least one parameter of a waveguide (3) from wavefield data acquired from wave propagation in the waveguide including obtaining first and second dispersion curves (9a, 9b, 9c) in the frequency domain from the wavefield data. A frequency interval between the first dispersion curve and the second dispersion curve is found, and this is used in the determination of at least one parameter of the waveguide. The frequency separation Δƒ(V) between the first and second dispersion curves may be found at a particular value of the phase velocity V, and the thickness h of the waveguide can be found using:Here, c1 is the velocity of wave propagation in the waveguide. This may be found from the asymptotic velocity values of the dispersion curves.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.