Patent · US Expired

Abnormality determining method, and abnormality determining apparatus and image forming apparatus using same

US7110917B2 · kind B2 · utility

31Cited by
89References
48Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 15, 2004
Grant dateSep 19, 2006
Priority date
Expiry dateNov 15, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/008
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An abnormality determining apparatus includes an information storage unit for storing normal index information serving as an index of a normal state of the detection subject, an information obtaining unit for obtaining a plurality of types of information, and an abnormality determining unit for determining the presence of an abnormality in the detection subject on the basis of the normal index information stored in the information storage unit, and the information obtained by the information obtaining unit. The information storage unit stores a plurality of normal index information having different values. The abnormality determining unit selects, at a predetermined timing, normal index information to be used to determine the presence of an abnormality in the detection subject from the plurality of normal index information.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.