Patent · US Expired

Multithread auto test method

US7111198B2 · kind B2 · utility

1Cited by
13References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 12, 2003
Grant dateSep 19, 2006
Priority date
Expiry dateDec 10, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/006
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A multithread auto test method is disclosed for the test process of computer hardware. According to the exclusion relation among the unique IDs of the test items, a multithread executable logic is automatically generated. An appropriate parallel method is employed to find procedures for test items that do not have conflictions. Therefore, multithreads of test procedures are performed to increase the test efficiency and quality. The method includes the steps of: determining a unique ID of a test item; automatically generating a test logic table according to the exclusion relation among the unique IDs; and performing multithread test procedure according to the test logic given in the test logic table.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.