Patent · US Expired

Apparatus and method for in-situ measuring of vibrational energy in a process bath of a vibrational cleaning system

US7111517B2 · kind B2 · utility

1Cited by
9References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 29, 2004
Grant dateSep 26, 2006
Priority date
Expiry dateAug 30, 2024

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S134/902
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Apparatus and method are provided for in-situ measurement of vibrational energy applied to a wafer in a process bath of a vibrational cleaning system. The apparatus may be made up of a test wafer comprising an array of pressure sensing elements disposed thereon for monitoring power level variation of a time-varying pressure wave. The time-varying pressure wave is indicative of vibrational energy that would be applied to a wafer in the process bath in the position of the test wafer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.