Automated dimensional inspection
US7111783B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 25, 2004 |
| Grant date | Sep 26, 2006 |
| Priority date | — |
| Expiry date | Dec 14, 2024 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P90/02
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
An automated dimensional inspection system is provided that modifies sensor planning based on real-time measurement feedback. The dimensional inspection system includes a sensor planner, an error map generator, and a sensor affixed to a movable member. The sensor planner is adapted to receive three dimensional design data for a workpiece to be measured and generate path data in part based on the dimensional design data for the workpiece, where the path data is indicative of a path for moving the sensor in relation to the surface of the workpiece. The error map generator is adapted to receive the dimensional design data and the three dimensional measurement data for the workpiece, and determine error data between the measurement data and the dimensional design data. Based on the error data, the sensor planner is able to further modify the path data for the sensor to increase the measurement accuracy.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.