Gauge calibration
US7112972B2 · kind B2 · utility
0Cited by
12References
7Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jun 20, 2003 |
| Grant date | Sep 26, 2006 |
| Priority date | — |
| Expiry date | Jun 20, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N33/32
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of calibrating a gauge in particular for the measurement of film thickness, uses a calibration variable to compensate for short term changes in probe tip condition, instead of a constant value. A calibration constant is based only on the dielectric constant for a coating such as lacquer, and is independent of the probe tip variable.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.