Patent · US Expired

Testing arrangement to distribute integrated circuits

US7112979B2 · kind B2 · utility

6Cited by
14References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 23, 2002
Grant dateSep 26, 2006
Priority date—
Expiry dateJul 23, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31718
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Arrangements having integrated circuit (IC) voltage and thermal resistance designated on a per IC basis.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.