Process for modelling a 3D scene
US7113635B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 25, 2003 |
| Grant date | Sep 26, 2006 |
| Priority date | — |
| Expiry date | Feb 22, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T17/20
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A process for modeling a 3D scene is provided which comprises validating the model by determining a maximum permitted distortion (5) on a 2D synthesized image (4), generated by the approximation inherent in the model (2); calculating for a point I of a reference image (7) and on a set of synthesized images (4) representing the 3D point of the scene corresponding to this point I, of the minimum (zi−Δzi1) and maximum (zi+Δzi2) depth values of the depth zi of this point I corresponding to this maximum distortion, calculating a span around the depth zi of this point I, dependant on the minimum value of the error Δzi2 and on the minimum value of the error Δzi1 among the values calculated for the synthesized images of the set.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.