Method and apparatus for semi-automatic extraction and monitoring of diode ideality in a manufacturing environment
US7113881B2 · kind B2 · utility
7Cited by
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21Claims
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Key dates
| Filing date | Nov 4, 2004 |
| Grant date | Sep 26, 2006 |
| Priority date | — |
| Expiry date | Mar 30, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2632
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method, an apparatus, and a computer program are provided for the semi-automatic extraction of an ideality factor of a diode. Traditionally, current/voltage curves for diodes, which provided a basis for extrapolating the ideality factors, had to be determined by hand. By employing a thermal voltage proportional to absolute temperature (PTAT) generator in conjunction with an extraction mechanism, the ideality factor can be extracted in an semi-automatic manner. Therefore, a reliable, quick, and less expensive device can be employed to improve measurements of ideality factors.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.