Time- of flight mass spectrometers for improving resolution and mass employing an impulse extraction ion source
US7115859B2 · kind B2 · utility
1Cited by
15References
8Claims
0Family size
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Key dates
| Filing date | Jul 17, 2003 |
| Grant date | Oct 3, 2006 |
| Priority date | — |
| Expiry date | Dec 18, 2023 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/40
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A miniature time-of-flight mass spectrometer (TOF-MS) and method for increasing the collection efficiency of laser-desorbed ions in a miniature time-of-flight mass spectrometer (TOF-MS) is provided. The method provides a laser pulse generated by an ionization extraction device within the TOF-MS; maintains a sample plate potential at a ground level for a fixed delay period of about 50 ns; and uses a high voltage switch to sharply increase the sample plate potential up to 10 kV/mm.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.