Patent · US Expired

Apparatus and method for testing infrared functions

US7115867B2 · kind B2 · utility

0Cited by
1References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 2, 2004
Grant dateOct 3, 2006
Priority date
Expiry dateJan 4, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04B10/07
  • WIPO fieldTelecommunications
  • WIPO sectorElectrical engineering

Abstract

An apparatus and method for testing infrared functions of infrared transceiver modules that is equipped with an infrared transmission capability mainly includes to start test operation before an infrared transceiver module being installed on an electronic device thereby to shorten test time of the infrared transceiver module, reduce test cost and improve production yield of the infrared transceiver module.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.