Patent · US Expired

Apparatus and method for simulating a battery tester with a fixed resistance load

US7116109B2 · kind B2 · utility

99Cited by
289References
16Claims
0Family size

Assignee

Inventor

Key dates

Filing dateNov 11, 2003
Grant dateOct 3, 2006
Priority date
Expiry dateMay 7, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/379
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and apparatus for simulating a battery tester with a fixed resistance load, such as a widely used Japanese load tester that rates the strength of Japanese batteries that are categorized under the Japanese Industrial Standard (JIS), are provided. This invention simulates such a device without invoking large current loads, yields familiar results, utilizes an existing database and provides more conclusive testing. The method includes measuring an open circuit voltage (OCV), temperature and a dynamic parameter of the battery. A load voltage of the battery is estimated as a function of the measured battery dynamic parameter, the OCV, the load resistance value of the load tester and the battery temperature. A bounceback voltage (BBV) of the battery is then predicted. The BBV, the load voltage and the battery temperature are utilized to rate the strength of the battery.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.