Method and system for testing driver circuits of amoled
US7116295B2 · kind B2 · utility
1Cited by
11References
16Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jun 13, 2003 |
| Grant date | Oct 3, 2006 |
| Priority date | — |
| Expiry date | Jun 9, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2300/0842
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method and a system for testing a plurality of driver circuits of an AMOLED before OLEDs are formed are provided. Each driver circuit includes a terminal, which is connected to an OLED after the OLED is formed, and is connected to a test element to form an electrical loop during the test. The system selects one specific driver circuit to test. The method and the system measure the value of a current signal flowing through the test element, and then analyze it to determine the status of the driver circuit. The said steps executed repeatedly, all driver circuits of the AMOLED are tested efficiently and precisely.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.