Wavelength-parallel polarization measurement systems and methods
US7116419B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 11, 2003 |
| Grant date | Oct 3, 2006 |
| Priority date | — |
| Expiry date | Jan 5, 2025 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04J14/06
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods for measuring the state of polarization (SOP) for each wavelength channel in a multi-wavelength-channel light beam are disclosed. The system includes a set of two or more rapidly switchable waveplates switched to form a sequence of secondary light beams having different polarizations. A polarizer filters the set of secondary light beams, and a spectral dispersing element spatially divides the secondary light beams into their respective wavelength components. A detector array measures in parallel the intensity of the different wavelength components for each of the polarization-filtered light beams. A controller stores the intensity measurements and calculates the Stokes parameters for each wavelength component, thereby characterizing the SOP for all the wavelength channels of the multi-wavelength light beam.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.