Patent · US Expired

Production method of a thin film device, production method of a transistor, electro-optical apparatus and electronic equipment

US7118943B2 · kind B2 · utility

8Cited by
14References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 17, 2003
Grant dateOct 10, 2006
Priority date
Expiry dateOct 13, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D86/0241
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

In this production method of a thin film device, a thin film is formed by discharging a liquid material from a nozzle in a deposition chamber to coat the liquid material onto a substrate. The substrate is then subjected to heat treatment by a first heat treatment unit and a second heat treatment unit, thereby improving the crystallinity and fitness of the film as well as its adhesion with other films.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.