Patent · US Expired

Semiconductor device

US7119428B2 · kind B2 · utility

91Cited by
4References
8Claims
0Family size

Assignees

Inventors

Key dates

Filing dateDec 28, 2004
Grant dateOct 10, 2006
Priority date
Expiry dateDec 28, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/19105
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A semiconductor device capable of reducing a temperature increase during operation thereof is provided. In the semiconductor device, an interface chip is stacked on a plurality of stacked semiconductor elements. Both an “Si” interposer and a resin interposer are arranged under the plural semiconductor elements. The Si interposer is arranged between the resin interposer and the plural semiconductor elements. The Si interposer owns a thickness which is thicker than a thickness of a semiconductor element, and also has a linear expansion coefficient which is smaller than a linear expansion coefficient of the resin interposer, and further, is larger than, or equal to linear expansion coefficients of the plural semiconductor elements.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.