Method and system for measuring differential scattering of light off of sample surfaces
US7119903B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 24, 2003 |
| Grant date | Oct 10, 2006 |
| Priority date | — |
| Expiry date | Sep 14, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/4711
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method is provided for estimating scattering and includes providing a distribution expression that includes first, second, and third integrals over a source solid angle, a sample area, and detector solid angle respectively, and an integrand that includes a differential-scattering profile; approximating the first and second integrals to be the second integral, wherein the source electromagnetic radiation is approximated to be collimated; approximating the second and third integral to be the third integral, wherein a detector for detecting the electromagnetic radiation scattered from the surface is approximated to be a point detector; transforming the coordinates of the third integral over detector solid angle to be a fourth integral over a single dimension in cosine space, wherein the surface is approximated to be shift invariant; differentiating the fourth integral with respect to the single dimension to generate the differential-scattering profile; and generating an optical system design based on the differential-scattering profile.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.