Systems and methods for providing forward mapping with visibility for and resolution of accumulated samples
US7120311B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 28, 2002 |
| Grant date | Oct 10, 2006 |
| Priority date | — |
| Expiry date | Mar 18, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T15/405
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Forward mapping is provided, which accumulates and resolves over all samples forward mapped to each pixel bin. During accumulation and resolution of each of the samples, since a point sample from a forefront object and a point sample from an occluded object may be received by the same bin, wherein only the former should be accumulated and resolved according to the accumulation and resolution process, a Z-range, or Z-interval, is assigned to each sample instead of the conventional Z-value. The Z-range is a function of the Z-value. Analysis of the overlapping of these Z-ranges then determines which samples are to be accumulated and resolved together according to the accumulation and resolution process, and which are not.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.