Patent · US Expired

Method of calibrating bias drift with temperature for a vibrating structure gyroscope

US7120548B2 · kind B2 · utility

3Cited by
5References
3Claims
0Family size

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Key dates

Filing dateNov 12, 2003
Grant dateOct 10, 2006
Priority date
Expiry dateNov 12, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01C19/567
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of calibrating bias drift with operating temperature over an operating temperature range for a vibrating structure gyroscope. The method includes the steps of measuring, over an operating temperature range of the vibrating structure gyroscope, primary drive means voltage P, vibrating structure frequency f, secondary drive quadrature component values Sq which is a measure of real component bias errors with temperature, and secondary drive real component values Sr which is a measure of change in bias, that is the zero inertial rate offset, of the vibrating structure gyroscope with temperature, substituting the values obtained in the relationshipwhere aklm are bias calibration coefficients for the vibrating structure gyroscope over the operating temperature range, and calculating from the relationship the coefficients aklm to provide a set of bias calibration coefficients for the vibrating structure gyroscope over the tested operating temperature range.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.