Apparatus and method for measuring operating temperatures of an electrical component
US7121721B2 · kind B2 · utility
1Cited by
5References
7Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 18, 2002 |
| Grant date | Oct 17, 2006 |
| Priority date | — |
| Expiry date | Jul 20, 2022 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/0002
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and a method for measuring operating temperatures Tj of a component, particularly transient temperatures Tj in the breakdown region of the component 2 during a breakdown operation, are provided. The component temperature Tj at a point of time ti is ascertainable from a measurement of the breakdown voltage Ud and the breakdown current I of the component 2 at the specific point of time ti during the breakdown operation using a measuring device, by comparing the measurement data to reference measurement data recorded in advance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.