Matrix-free desorption ionization mass spectrometry using tailored morphology layer devices
US7122790B2 · kind B2 · utility
9Cited by
21References
67Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 13, 2002 |
| Grant date | Oct 17, 2006 |
| Priority date | — |
| Expiry date | Jun 17, 2022 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T436/25
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
There is disclosed an apparatus for providing an ionized analyte for mass analysis by photon desorption comprising at least one layer for contacting an analyte, and a substrate on which said layer is deposited. Upon irradiation of said apparatus, said analyte desorbs and ionizes for analysis by mass spectrometry. The layer or layers of said apparatus comprise a continuous film, a discontinuous film or any combinations thereof.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.