Patent · US Expired

Chip and multi-chip semiconductor device using thereof and method for manufacturing same

US7122912B2 · kind B2 · utility

301Cited by
3References
20Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 25, 2005
Grant dateOct 17, 2006
Priority date
Expiry dateJan 25, 2025

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/975
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The chip for the multi-chip semiconductor device having the markings for alignment formed on the front surface and/or the back surface of the chip only by the processing from the front surface of the chip (photolithography, etch) and the method for manufacturing same are presented, without adding any dedicated process step to the formation process for the marking for alignment. In the chip for the multi-chip semiconductor device having two or more electroconductive through plug in one chip for the multi-chip semiconductor device, one or more electroconductive through plugs are employed for the marking for alignment, and the chip is configured to allow identification of the marking for alignment on the front surface and/or the back surface of the chip for the multi-chip semiconductor device. Then, an insulating film is provided on the front surface and/or the back surface of the electrically conducting through plug.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.