Method for testing OLED substrate and OLED display
US7122970B2 · kind B2 · utility
13Cited by
5References
7Claims
0Family size
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Key dates
| Filing date | Aug 25, 2004 |
| Grant date | Oct 17, 2006 |
| Priority date | — |
| Expiry date | Oct 25, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G3/006
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method for testing an OLED substrate comprises: the first step of obtaining a first current value passing through a switching element group connected to a selection signal line; the second step of obtaining a second current value passing through a switching element group connected to a data signal line; and the third step of operating a current passing through each switching element including an OLED element from the current value for each pulse signal obtained by each of the steps 1 and 2.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.