Method and apparatus for testing driver circuits of AMOLED
US7123043B2 · kind B2 · utility
2Cited by
3References
5Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 13, 2004 |
| Grant date | Oct 17, 2006 |
| Priority date | — |
| Expiry date | May 14, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2300/0842
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method and an apparatus for testing a plurality of driver circuits of an AMOLED before OLEDs are implanted are provided. The method and the apparatus select one specific driver circuit to be tested and dispose a conductive board above the array glass of the OLED to form a capacitor. By using the data line, the scan line, and the power line of an AMOLED, the present invention is able to input and retrieve signals from driver circuits for analyzing each of them is normal or not.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.