System and method for measuring current
US7123104B2 · kind B2 · utility
5Cited by
5References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 20, 2003 |
| Grant date | Oct 17, 2006 |
| Priority date | — |
| Expiry date | Aug 20, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R19/0092
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention is directed to a system and method for measuring a current in an integrated circuit comprising measuring a first output count from a first voltage controlled oscillator (VCO) using a first measurement voltage, simultaneously measuring a second output count from a second VCO using a second measurement voltage, and calculating the current in the integrated circuit using a voltage proportional to a difference between the first and second output counts.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.