Patent · US Expired

Arrangement for examining microscopic preparations with a scanning microscope, and illumination device for a scanning microscope

US7123408B2 · kind B2 · utility

1Cited by

49References

7Claims

0Family size

Assignee

LEICA MICROSYSTEMS CMS GMBH · DE

Inventors

Holger Birk · Meckesheim, DE
Rafael Storz · Heidelberg, DE

Key dates

Filing date	Jan 14, 2005
Grant date	Oct 17, 2006
Priority date	—
Expiry date	Jan 14, 2025

Classification

Technology area (CPC H)Electricity
CPC primaryH01S3/1636
WIPO fieldOptics
WIPO sectorInstruments

Abstract

The arrangement for examining microscope preparations with a scanning microscope comprises a laser (1) and an optical means (12) which images the light generated by the laser (1) onto a specimen (13) that is to be examined. Provided between the laser (1) and the optical means (12) is an optical component (3, 20) that spectrally spreads, with a single pass, the light generated by the laser (1). The optical component (3, 20) is made of photonic band-gap material. It is particularly advantageous if the photonic band-gap material is configured as a light-guiding fiber (20).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.