Method of controlling localized shape of a data head and for characterizing the shape
US7124497B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 18, 2003 |
| Grant date | Oct 24, 2006 |
| Priority date | — |
| Expiry date | Jan 22, 2025 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/49041
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method and apparatus are provided characterizing the shape of a surface such as a bearing surface on a slider and for processing the shape. The shape is characterized by fitting a curve having a desired shape to measurement data and then determining residual deviations from the desired shape within localized regions. The surface is processed by selecting a material stress pattern to be applied to a working surface of the slider based on measured and desired contour shape parameters in a plurality of localized areas on the bearing surface. The measured contour shape parameter within a first of the plurality of localized areas is weighted more heavily than those within the other localized areas.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.