Patent · US Expired

Glide-height disk-tester and method of operation

US7124625B1 · kind B1 · utility

12Cited by
23References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 17, 2005
Grant dateOct 24, 2006
Priority date
Expiry dateMay 17, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11B5/6076
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

A glide-height disk-tester operates with the test disk rotating at a predetermined constant rotational speed and uses a glide head with an electrically-resistive heater and a thermally-responsive protrusion pad located on its trailing end. The linear velocity of the disk relative to the slider maintains the slider at its nominal fly height, which is typically higher than any expected asperity. With no current applied to the heater, the protrusion pad is generally flush with the air-bearing surface of the slider. Increasing levels of current are applied to the heater, which causes movement of the protrusion pad toward the disk surface. When the pad contacts an asperity, the current level applied at the instant of asperity contact is recorded. The applied current level can be correlated to the glide height from a previous calibration process using a calibration disk with known calibration bump heights.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.