Method and system for mass analysis of samples
US7126114B2 · kind B2 · utility
27Cited by
16References
31Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Feb 24, 2005 |
| Grant date | Oct 24, 2006 |
| Priority date | — |
| Expiry date | Feb 24, 2025 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/40
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A system and method of analyzing a sample is described. The system includes an ion source and a deflector for producing a plurality of ion beams each of which is detected in distinct detection regions. A detection system uses the information obtained from the detection region to analyze the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.