Method for the contactless measurement of an object
US7126144B2 · kind B2 · utility
6Cited by
8References
14Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jan 7, 2004 |
| Grant date | Oct 24, 2006 |
| Priority date | — |
| Expiry date | Jan 7, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/2433
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to a method for the contactless measurement of an object in at least one dimension. An object is scanned in a spatially restricted effective zone of a scanning beam field and the size of the object in terms of the measured dimension is deduced by the detection of one or more interruptions in the scanning beams. The scanning beam field is constructed from a number of directly addressable individual beams. The beam-assisted scanning of the spatially restricted effective zone of the scanning beam field is carried out according to a predefinable pattern of steps, using a non-linear soiling method.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.