Patent · US Expired

Method and circuit arrangement for determining an electric measurement value for a resistance element, preferably for determining an electric current that flows through the said resistance element

US7126353B2 · kind B2 · utility

9Cited by
3References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 22, 2003
Grant dateOct 24, 2006
Priority date
Expiry dateOct 22, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R27/14
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The invention relates to a method and a circuit arrangement for determining an electric measurement value for a resistance element (R22), preferably for determining an electric current that flows through said resistance element (R22), whereby the resistance element (R22) to be measured is interconnected to additional resistance elements within a resistance array (2) consisting of columns (CL1, CL2, CL3) and rows (R1, R2, R3) of resistance elements. According to the invention, the load of a basic load resistance element (R13), which is connected between the output of a measurement/supply unit (1) and the common ground terminal connection of the resistance array (2), is applied to the measurement voltage (MEAS). The measurement voltage (MEAS) is simultaneously connected to the input of an impedance transformer (OCL, OR), whose output is connected in a subsequent step to the resistance elements in the resistance array (2) that are not to be measured. This prevents a voltage differential at the input of the operation amplifier, eliminating to a great extent undesired signal fluctuations, which could falsify the measurement result.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.