Patent · US Expired

Read-accessible column latch for non-volatile memories

US7126860B2 · kind B2 · utility

4Cited by
7References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 3, 2005
Grant dateOct 24, 2006
Priority date
Expiry dateJan 3, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C16/3459
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Program column latch circuitry of nonvolatile memory is provided with read-back capability to verify that data bits have been correctly loaded into the latch circuits and written to the memory cells. The interface between the low voltage latches and the external input and output data paths is provided with opposite-facing tri-state buffers that allow latched data to be read out for comparison and verification. Writing of latched data to memory cells can be verified by the read-back without needing any external RAM.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.