Method for testing analog and mixed-signal circuits using functionally related excitations and functionally related measurements
US7129734B2 · kind B2 · utility
12Cited by
3References
26Claims
0Family size
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Key dates
| Filing date | May 21, 2004 |
| Grant date | Oct 31, 2006 |
| Priority date | — |
| Expiry date | Jun 13, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3167
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for testing a circuit includes determining at least one performance characteristic of the circuit based on a functional relationship between excitation signals or on a functional relationship between measurement devices. The method is implemented either as a part of a built-in self test circuit of an integrated circuit or for production testing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.