Metrology system and method for measuring five degrees-of-freedom for a point target
US7130034B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 26, 2004 |
| Grant date | Oct 31, 2006 |
| Priority date | — |
| Expiry date | Feb 18, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01C15/002
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A metrology system includes a laser, a position sensitive detector array, a first collimator, a second collimator, and a mirror. The position sensitive detector array and the first collimator are positioned at a reference point. The second collimator and the mirror are positioned at a point target at a distance from the reference point. A laser beam is alternately provided to the first collimator and the second collimator by optical fiber. The position sensitive detector array measures position data from a first laser crosshair generated by the first collimator and from a second laser crosshair generated by the second collimator. By alternating the activation of the first collimator and the second collimator it is possible to measure 5 degrees-of-freedom for the point target. A metrology system processing unit provides analog data processing. The metrology system that is suitable for, but not limited to, facilitating active compensation of large spacecraft structures.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.