One-dimensional modeling of the manufacture of multi-layered material
US7130781B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 10, 2002 |
| Grant date | Oct 31, 2006 |
| Priority date | — |
| Expiry date | Mar 5, 2024 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P90/02
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
In general, techniques are described for the creation and execution of accurate models for the manufacture of complex, multi-layered materials. The techniques may be used to calculate variations of a process parameter within the material during the manufacturing process. A method comprises receiving segment data that partitions a manufacturing process into a set of segments having at least one layer of a material. For example, the segment data may partition the manufacturing processes along a path traversed by the material within the manufacturing process. The method further comprises receiving curvature data for the layers, and calculating values for a process parameter through the layers of the segments as a function of the curvature data. The method may comprise invoking a one-dimensional model, such as a one-dimensional finite difference model, to calculate the values for the defined segments and layers.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.